Imaging of Rough Surfaces by RTM Method

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dc.authoridYelkenci, Ahmet Tanju/0000-0002-3668-7751
dc.authoridSEFER, AHMET/0000-0001-5168-4367
dc.contributor.authorSefer, Ahmet
dc.contributor.authorYapar, Ali
dc.contributor.authorYelkenci, Tanju
dc.date.accessioned2025-02-20T08:42:15Z
dc.date.available2025-02-20T08:42:15Z
dc.date.issued2024
dc.departmentTürk-Alman Üniversitesien_US
dc.description.abstractAn electromagnetic (EM) imaging framework is implemented utilizing a single-frequency reverse time migration (RTM) technique to accurately reconstruct inaccessible 2-D rough surface profiles from the knowledge of scattered field data. The unknown surface profile, which is expressed as a 1-D height function, is either perfectly electric conducting (PEC) or an interface between two penetrable media. For both cases, it is assumed that the surface is illuminated by a number of line sources located in the upper medium. The scattered fields, which should be collected by real measurements in practical applications, are obtained synthetically by solving the associated direct scattering problem through the surface integral equations. RTM is subsequently applied to generate a cross correlation imaging function which is evaluated numerically and provides a 2-D image of the region of interest. A high correlation is observed by the function in the regions where the transitions between two media occur. Hence, it results in the acquisition of the unknown surface profile at the sites where the function attains its highest values. The efficiency of the proposed method is comprehensively tested by numerical examples covering various types of scattering scenarios.
dc.identifier.doi10.1109/TGRS.2024.3374972
dc.identifier.issn0196-2892
dc.identifier.issn1558-0644
dc.identifier.scopus2-s2.0-85187365465
dc.identifier.scopusqualityQ1
dc.identifier.urihttps://doi.org/10.1109/TGRS.2024.3374972
dc.identifier.urihttps://hdl.handle.net/20.500.12846/1600
dc.identifier.volume62en_US
dc.identifier.wosWOS:001189388400013
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherIeee-Inst Electrical Electronics Engineers Inc
dc.relation.ispartofIeee Transactions On Geoscience and Remote Sensing
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20250220
dc.subjectInverse electromagnetic (EM) scattering problemsen_US
dc.subjectreverse time migration (RTM)en_US
dc.subjectrough surface reconstructionen_US
dc.titleImaging of Rough Surfaces by RTM Method
dc.typeArticle

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