Yazar "Micha, J. S." için listeleme
-
Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-imensional energy-dispersive detector
Abboud, Ali; Kirchlechner, C.; Keckes, J.; Çonka Yıldız, Tuba; Send, S.; Micha, J. S.; Pietsch, U. (Int Union Crystallography, 2017)The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using ...
