Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a two-imensional energy-dispersive detector
Yükleniyor...
Dosyalar
Tarih
2017
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Int Union Crystallography
Erişim Hakkı
info:eu-repo/semantics/openAccess
Özet
The full strain and stress tensor determination in a triaxially stressed single crystal using X-ray diffraction requires a series of lattice spacing measurements at different crystal orientations. This can be achieved using a tunable X-ray source. This article reports on a novel experimental procedure for single-shot full strain tensor determination using polychromatic synchrotron radiation with an energy range from 5 to 23 keV. Microbeam X-ray Laue diffraction patterns were collected from a copper micro-bending beam along the central axis (centroid of the cross section). Taking advantage of a two-dimensional energy-dispersive X-ray detector (pnCCD), the position and energy of the collected Laue spots were measured for multiple positions on the sample, allowing the measurement of variations in the local microstructure. At the same time, both the deviatoric and hydrostatic components of the elastic strain and stress tensors were calculated.
Açıklama
Conka, Tuba/0000-0003-0671-3805
WOS:000402701600027
PubMed: 28656042
WOS:000402701600027
PubMed: 28656042
Anahtar Kelimeler
Strain, Microbeam X-Ray Laue Diffraction, Energy-Dispersive X-Ray Detectors
Kaynak
Journal Of Applied Crystallography
WoS Q Değeri
Q2
Scopus Q Değeri
Q1
Cilt
50
