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Imaging of Rough Surfaces by RTM Method
(Ieee-Inst Electrical Electronics Engineers Inc, 2024) Sefer, Ahmet; Yapar, Ali; Yelkenci, Tanju
An electromagnetic (EM) imaging framework is implemented utilizing a single-frequency reverse time migration (RTM) technique to accurately reconstruct inaccessible 2-D rough surface profiles from the knowledge of scattered field data. The unknown surface profile, which is expressed as a 1-D height function, is either perfectly electric conducting (PEC) or an interface between two penetrable media. For both cases, it is assumed that the surface is illuminated by a number of line sources located in the upper medium. The scattered fields, which should be collected by real measurements in practical applications, are obtained synthetically by solving the associated direct scattering problem through the surface integral equations. RTM is subsequently applied to generate a cross correlation imaging function which is evaluated numerically and provides a 2-D image of the region of interest. A high correlation is observed by the function in the regions where the transitions between two media occur. Hence, it results in the acquisition of the unknown surface profile at the sites where the function attains its highest values. The efficiency of the proposed method is comprehensively tested by numerical examples covering various types of scattering scenarios.